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0 索取号:D731.02/E991 作者: 出版社:Aldershot, Hants, England ; Brookfield, Vt., USA : Ashgate, c1998.
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0 索取号:D733.02/E991 作者: 出版社:Aldershot, Hants, England ; Brookfield, Vt., USA : Ashgate, c1998.
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0 索取号:D871.22/E992 作者:Cumings、 Bruce、 1943-、 出版社:Durham : Duke University Press, 1999.
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0 索取号:D5/E20011.4 作者:Lundestad、 Geir、 1945-、 出版社:Oxford [U.K.] ; New York : Oxford University Press, 1999.
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0 索取号:F133.05/E20011 作者:Henderson、 Jeannie、International Institute for Strategic Studies、 出版社:Oxford ; New York : Oxford University Press for the International Institute for Strategic Studies, 1999.
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0 索取号:TN27-53/E806/1976 作者:Workshop on Standards for Image Pattern Recognition、 National Bureau of Standards、 1976.、Evans、 John M. (John Martin)、 1942-、Kirsch、 Russell A.、Nagel、 Roger N.、 1943-、United States. National Bureau of Standards.、 出版社:[Washington] : GPO U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
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0 索取号:TN018-53/E801 作者:NATO Advanced Study Institute (1974 : Sp̊Аtind、 Norway)、Holtet、 J. A. (Jan A.)、 1939-、 出版社:Dordrecht ; Boston : D. Reidel Pub. Co., 1974.
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0 索取号:TN018-53/E802 作者:Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、 出版社:Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971
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0 索取号:TN019.2-7/E801/1979 作者:IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、 出版社:New York : Institute of Electrical and Electronics Engineers, c1979
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0 索取号:TN1-53/E901/1990.1 作者:IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、 出版社:New York, NY : Institute of Electrical and Electronics Engineers, c1989
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0 索取号:TN1-53/E901/1990.2 作者:IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、 出版社:New York, NY : Institute of Electrical and Electronics Engineers, c1989
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0 索取号:TN1-53/E901/1990.3 作者:IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、 出版社:New York, NY : Institute of Electrical and Electronics Engineers, c1989
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0 索取号:TN1-53/E901/1987.1 作者:IEEE Southeastcon (1987 : Tampa、 Fla.)、Institute of Electrical and Electronics Engineers. Region 3.、 出版社:New York, NY : Institute of Electrical and Electronics Engineers, c1987.
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0 索取号:TN1-53/E901/1987.2 作者:IEEE Southeastcon (1987 : Tampa、 Fla.)、Institute of Electrical and Electronics Engineers. Region 3.、 出版社:New York, NY : Institute of Electrical and Electronics Engineers, c1987.
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0 索取号:TN106/E802 作者:Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、 出版社:New York : M. Dekker, 1977.
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0 索取号:TN153-53/E804/1974 作者:Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、 出版社:Chicago Ill. : IIT Research Institute, 1973.
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